The chip testing conductive rubber has multiple advantages compared to probes. Below is a detailed summary of these advantages:
Conductive Rubber: It performs excellently in high-frequency testing, particularly for high-speed chips such as RF chips. Conductive rubber provides stable electrical connections, ensuring the reliability and stability of signal transmission. Its high-frequency testing performance is superior, with a thickness as minimal as 0.2mm and an insulation layer dielectric constant as low as 3.5, helping to reduce signal interference and distortion.
Probe: Although probes are widely used in general testing, their performance may be somewhat limited in high-frequency testing, particularly regarding the stability and reliability of signal transmission.
Conductive Rubber: It has a high testing density, capable of achieving high-density test point layouts, with the minimum test point as small as 0.075mm and the distance between two minimum test point centers only 0.15mm. Additionally, conductive rubber offers high contact stability and a contact resistance of less than 100 milliohms, ensuring high-quality signal transmission during testing.
Probe: The testing density and contact stability may be limited by its physical structure and size, making it challenging to achieve the same high density and high stability testing as conductive rubber.
Conductive Rubber: During testing, conductive rubber can provide a layer of protection for the chip, reducing potential risks caused by improper handling, such as mechanical damage and electrostatic damage. This is crucial for protecting expensive chips and extending their lifespan.
Probe: While probes also aim to avoid damaging the chip during testing, their protection effect may not be as significant as that of conductive rubber.
Conductive Rubber: It offers significant cost advantages, especially in scenarios requiring a large number of test points. The more test points needed, the more apparent the cost advantage of conductive rubber becomes. Furthermore, the maintenance of conductive rubber is relatively convenient, requiring only simple and quick periodic cleaning of the socket.
Probe: In contrast, probes may incur higher costs, especially when a large number of test points or high-precision testing is required. Additionally, the maintenance of probes can be more complex and time-consuming.
Conductive Rubber: It is suitable for various chip testing scenarios, particularly for high-frequency, high-speed, and high-precision testing requirements. It offers strong flexibility and adaptability, able to meet diverse testing needs.
Probe: Probes also have unique advantages in specific testing scenarios, such as direct measurement and high flexibility. However, in some aspects, they may not be as adaptable as conductive rubber.
In summary, chip testing conductive rubber offers several advantages compared to probes, such as superior high-frequency testing performance, high testing density and contact stability, excellent chip protection, significant cost advantages, and strong applicability and flexibility. However, the specific choice of testing method should still be based on actual needs, testing environment, cost budget, and other factors.
