Jun 07 , 2024
The DDR/LPDDR/Flash Test Socket is specifically designed to accommodate DDR (Double Data Rate), LPDDR (Low Power Double Data Rate), and Flash memory modules for precise testing. Based on robust construction and precise engineering, our test sockets, such as LPDDR4/DDR4 socket, LPDDR5/DDR5 socket, memory test socket, etc., ensure reliable contact and signal transmission, facilitating comprehensive testing procedures for memory devices.
| Memory Test Rubber | Specification |
| Socket(DDR/LPDDR/Flash/EMMC) | Package Type |
| The optimized solution for memory | BGA/LGA etc |
| Device/PKG | Available Pitch |
| 0.25mm-1.27mm |
Low contact force
Durable and consistent contact
Excellent electrical impedance(<100mΩ)
Easy to maintain and replace
Long life span
No ball damage
DDR/LPDDR/Flash Test Sockets find applications in various scenarios:
Semiconductor Manufacturing: DDR/LPDDR/Flash sockets ensure the quality and reliability of DDR, LPDDR, and Flash memory modules before integration into electronic devices.
Product Development: DDR sockets, flash sockets, and other memory test sockets facilitate testing during the design and development phase of electronic products, ensuring compatibility and performance.
Quality Assurance: These memory test sockets enable comprehensive testing to verify the functionality, performance, and reliability of memory components in different operating conditions.
Repair and Maintenance: DDR4 sockets, DDR5 sockets, LPDDR sockets, flash sockets and other memory sockets support troubleshooting and diagnosis of faulty memory modules in electronic devices, allowing for efficient repair and maintenance processes.
Research and Development: These memory sockets provide researchers and engineers with a tool for evaluating the performance of new memory technologies and optimizing their designs.
Enhanced Compatibility: Memory test sockets are designed to accommodate the latest DDR, LPDDR, and Flash memory modules, ensuring compatibility with the newest technologies.
Increased Durability: Utilization of advanced materials and construction techniques to enhance the durability and lifespan of memory test sockets, allowing for prolonged use in testing environments.
Higher Throughput: Introduction of high-speed interfaces and improved contact designs to support higher data rates, enabling faster testing of memory modules without compromising accuracy.
